Analytical Electron Microscopy of Thin Film / Ionic Liquid Interfaces Prepared using a Focused Ion Beam

Autor:	Juan C. Idrobo, Jennifer D. Sloppy, Robert C. Devlin, Mitra L. Taheri, R. J. Sichel-Tissot, Andrew C. Lang, Hessam Ghassemi, Steven J. May
Rok vydání:	2013
Předmět:	Materials science business.industry Analytical chemistry Focused ion beam Analytical electron microscopy chemistry.chemical_compound Ion beam deposition chemistry Ionic liquid Optoelectronics Thin film Electron beam-induced deposition business Instrumentation
Zdroj:	Microscopy and Microanalysis. 19:1636-1637
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927613010179
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::57caab196b79c73b4facea867017844b https://doi.org/10.1017/s1431927613010179 Zobrazit plný text záznamu