High-Resolution AFM-Based Force Spectroscopy
| Autor: | Anna E. Pittman, Gavin M. King, Krishna P. Sigdel, Tina R. Matin |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
0301 basic medicine
chemistry.chemical_classification Yield (engineering) Cantilever Materials science Atomic force microscopy business.industry Biomolecule Force spectroscopy High resolution 02 engineering and technology 021001 nanoscience & nanotechnology Focused ion beam 03 medical and health sciences 030104 developmental biology chemistry Surface modification Optoelectronics 0210 nano-technology business |
| Zdroj: | Methods in Molecular Biology ISBN: 9781493985906 |
| DOI: | 10.1007/978-1-4939-8591-3_4 |
| Popis: | Atomic force microscopy (AFM)-based force spectroscopy is a powerful technique which has seen significant enhancements in both force and time resolution in recent years. This chapter details two AFM cantilever modification procedures that yield high force precision over different temporal bandwidths. Specifically, it explains a fairly straightforward method to achieve sub-pN force precision and stability at low frequencies ( |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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