Surface inversion layer effective minority carrier mobility as one of the measures of surface quality of the p-aSi:H/i-aSi:H/cSi heterojunction solar cell

Autor:	Y. Hayashi, T. Kamioka, K. Gotoh, R. Ozaki, K. Nakamura, M. Morimura, S. Naitou, N. Usami, A. Ogura, Y. Ohshita
Rok vydání:	2019
Předmět:	Surface (mathematics) Electron mobility Materials science Quality (physics) law business.industry Solar cell Optoelectronics Inversion (meteorology) Heterojunction business Layer (electronics) law.invention
Zdroj:	Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials.
DOI:	10.7567/ssdm.2019.c-6-02
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::577e6097d9385cc13abef9c86cf17f9f https://doi.org/10.7567/ssdm.2019.c-6-02 Zobrazit plný text záznamu