A Comparative Study of the Growth of Cr on (110)TiO2Rutile, (0001) -Al2O3and (100)SrTiO3Surfaces
| Autor: | Qiang Fu, F. Phillipp, Thomas Wagner, C. Winde, S. Tsukimoto |
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| Rok vydání: | 2004 |
| Předmět: |
Auger electron spectroscopy
Materials science Oxide Analytical chemistry Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention chemistry.chemical_compound X-ray photoelectron spectroscopy chemistry Transmission electron microscopy law Rutile General Materials Science Scanning tunneling microscope Single crystal Molecular beam epitaxy |
| Zdroj: | Interface Science. 12:117-126 |
| ISSN: | 0927-7056 |
| DOI: | 10.1023/b:ints.0000012303.59127.37 |
| Popis: | Thin Cr films were deposited on single crystal α-Al2O3, SrTiO3 and TiO2 (rutile) substrates under ultrahigh vacuum conditions using molecular beam epitaxy (MBE). The growth behavior and thermal stability of the films were investigated with scanning tunneling microscopy (STM), X-ray phototelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and transmission electron microscopy (TEM). Cr grew as 3D clusters on all substrates. For all three Cr/oxide systems a strong temperature dependent interfacial reaction was observed. The results suggested that these reactions depended greatly on thermodynamics and on transport properties in the oxide substrates. |
| Databáze: | OpenAIRE |
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