Development of a Visual Inspection System for Wafer Handling with Collets

Autor:	Kuk Won Ko, Ji Yeon Lee
Rok vydání:	2023
Zdroj:	Journal of the Korean Society of Manufacturing Technology Engineers. 32:29-36
ISSN:	2508-5107
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::56e613178f2e4ebcce1ff91b870532ee https://doi.org/10.7735/ksmte.2023.32.1.29 Zobrazit plný text záznamu