Autor:	Jason F. Ross, Keith K. Sturcken, S. Doyle
Rok vydání:	2012
Předmět:	Engineering Random access memory Hardware_MEMORYSTRUCTURES Missile CMOS business.industry Electronic engineering Electrical engineering Hardware_PERFORMANCEANDRELIABILITY Static random-access memory Hardware_ARITHMETICANDLOGICSTRUCTURES business Radiation hardening
Zdroj:	2012 IEEE Aerospace Conference.
DOI:	10.1109/aero.2012.6187231
Popis:	Technology status and qualification test results are discussed on two new deep submicron radiation hardened devices including a 64Mb SRAM family and stacked MCM versions of the C-RAM non-volatile memory. Electrical characterization and radiation test results will be discussed.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::56be493d1cc522450f6f7885a31953be https://doi.org/10.1109/aero.2012.6187231 Zobrazit plný text záznamu