Development of a shear-force scanning near-field cathodoluminescence microscope for characterization of nanostructures’ optical properties
| Autor: | N.B. Bercu, M. Troyon, Michael Molinari |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Histology Nanostructure Materials science Scanning electron microscope business.industry Resolution (electron density) Bimorph Cathodoluminescence 02 engineering and technology 021001 nanoscience & nanotechnology 01 natural sciences Pathology and Forensic Medicine Characterization (materials science) Optics 0103 physical sciences Cathodoluminescence microscope Near-field scanning optical microscope 0210 nano-technology business |
| Zdroj: | Journal of Microscopy. 263:357-364 |
| ISSN: | 0022-2720 |
| DOI: | 10.1111/jmi.12407 |
| Popis: | An original scanning near-field cathodoluminescence microscope for nanostructure characterization has been developed and successfully tested. By using a bimorph piezoelectric stack both as actuator and detector, the developed setup constitutes a real improvement compared to previously reported SEM-based solutions. The technique combines a scanning probe and a scanning electron microscope in order to simultaneously offer near-field cathodoluminescence and topographic images of the sample. Share-force topography and cathodoluminescence measurements on GaN, SiC and ZnO nanostructures using the developed setup are presented showing a nanometric resolution in both topography and cathodoluminescence images with increased sensitivity compared to classical luminescence techniques. |
| Databáze: | OpenAIRE |
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