A convenient and practical procedure to derive correction factors to estimate atomic ratios by XPS

Autor:	Tamotsu Nakamura, Retsu Oiwa, Takahiro Hoshi, Atsushi Ogata
Rok vydání:	1998
Předmět:	Cross section (physics) X-ray photoelectron spectroscopy Reference sample Chemistry Analytical chemistry Photoionization Sensitivity (control systems) Factor method Biochemistry Intensity (heat transfer) Computational physics
Zdroj:	Fresenius' Journal of Analytical Chemistry. 362:254-257
ISSN:	1432-1130 0937-0633
DOI:	10.1007/s002160051069
Popis:	In quantitative XPS, the preparation of reference samples is difficult or impossible, and the correction factor method has been employed. Therefore, a convenient and practical procedure to get correction factors to estimate atomic ratios is proposed, in which it is assumed that the XPS intensity distribution corresponds to the distribution of the photoionization cross section. This procedure can be applied to some instruments and various samples without the previous collection, preparation of reference sample groups, and determination of sensitivity factors for each element.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5577bb4c308d9bb79262593309bdf4f5 https://doi.org/10.1007/s002160051069 Zobrazit plný text záznamu Full text from SpringerLink