Methodology for an efficient characterization flow of industrial grade Si-based qubit devices

Autor:	L.C. Contamin, B. Cardoso Paz, B. Martinez Diaz, B. Bertrand, H. Niebojewski, V. Labracherie, A. Sadik, E. Catapano, M. Casse, E. Nowak, Y.-M. Niquet, F. Gaillard, T. Meunier, P.-A. Mortemousque, M. Vinet
Rok vydání:	2022
Zdroj:	2022 International Electron Devices Meeting (IEDM).
DOI:	10.1109/iedm45625.2022.10019396
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5555a03bdbc307c64c073fddefe88795 https://doi.org/10.1109/iedm45625.2022.10019396 Zobrazit plný text záznamu