Single-event burnout of LDMOS with polygon P+ structure

Autor:	Shiping Wang, Xiaowu Cai, Xiaojing Li, Duoli Li, Chuanbin Zeng, Meichen Jin, Jiajia Wang, Jiangjiang Li, Fazhan Zhao, Bo Li
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Condensed Matter Physics Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials
Zdroj:	Microelectronics Reliability. 138:114715
ISSN:	0026-2714
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::550c3422d13a4e6f6e8952c83ab161f2 https://doi.org/10.1016/j.microrel.2022.114715 Zobrazit plný text záznamu Full Text from ScienceDirect