The Use of Electron Ptychography to Implement Efficient Phase Imaging in STEM

Autor:	Martin Huth, Martin Simson, Timothy J. Pennycook, R Sa gawa, Lothar Striider, Hao Yang, R N Rutte, Lewys Jones, Gerardo T. Martinez, Peter D. Nellist, Yukihito Kondo, Heike Soltau, B D Davis
Rok vydání:	2016
Předmět:	010302 applied physics Materials science business.industry 02 engineering and technology Electron 021001 nanoscience & nanotechnology 01 natural sciences Ptychography Optics 0103 physical sciences Phase imaging 0210 nano-technology business Instrumentation
Zdroj:	Microscopy and Microanalysis. 22:466-467
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927616003184
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::550929ce754aee8ca702a3102ce66d2e https://doi.org/10.1017/s1431927616003184 Zobrazit plný text záznamu