An experimental investigation of the end-hat effects in a crossed-field amplifier via three-dimensional electron density measurements

Autor:	J.Z. Ye, T.E. Ruden, R. MacGregor, C. Chan
Rok vydání:	1994
Předmět:	Physics Electron density Crossed-field amplifier business.industry Amplifier Biasing Electron Space charge Electronic Optical and Magnetic Materials law.invention Optics law Electric field Electrical and Electronic Engineering Atomic physics business Electron population
Zdroj:	IEEE Transactions on Electron Devices. 41:258-265
ISSN:	0018-9383
Popis:	In situ three-dimensional electron density profile measurements have been made for the first time to study the end-hat space-charge region in a crossed-field amplifier. It has been found that a separated electron population exists in that region and is detached from the main beam when the end-hats are biased positively with respect to the sole. An investigation into the vacuum electric field profile and the overall device performance versus end-hat bias has suggested that such an electron population may be caused by a redistribution of the beam electrons by the axial and radial end-hat electric field. >
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::54ef4b79df5d3d7cd9b3f7df8a6faf0b https://doi.org/10.1109/16.277369 Zobrazit plný text záznamu