Methods for testing signals considering jitter transfer function

Autor: Kenichi Nagatani
Rok vydání: 2018
Předmět:
Zdroj: 2018 China Semiconductor Technology International Conference (CSTIC).
DOI: 10.1109/cstic.2018.8369266
Popis: A signal with a jitter in excess of one unit interval will result in a failure of functional testing because the signal and its expected data are misaligned. Additionally, jitter measurements performed without considering the correct jitter transfer function (JTF) will yield incorrect results. Here, two methods are presented: one for functional testing while countering jitter and the other that considers the JTF for measuring jitter. The new methods use a time measurement unit (TMU) in automatic test equipment (ATE) and signal processing.
Databáze: OpenAIRE