Development of Spectral-Domain Interferometer Having Dual Reference Paths based on Polarization for Measuring Absolute Distances

Autor:	Jungjae Park, Jonghan Jin, Heulbi Ahn, Yeoungjun Kim
Rok vydání:	2020
Předmět:	Physics Interferometry Optics business.industry Mechanical Engineering Spectral domain Safety Risk Reliability and Quality business Polarization (waves) Industrial and Manufacturing Engineering
Zdroj:	Journal of the Korean Society for Precision Engineering. 37:181-186
ISSN:	2287-8769 1225-9071
DOI:	10.7736/jkspe.019.130
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::54c32d5966f27c02ab67caa6e74f2187 https://doi.org/10.7736/jkspe.019.130 Zobrazit plný text záznamu