| Autor: |
K.V. Kasiviswanathan, V. Karthik, K. Bhanu Sankara Rao, Sunil Goyal, M. Valsan, Baldev Raj |
| Rok vydání: |
2010 |
| Předmět: |
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| Zdroj: |
Materials & Design (1980-2015). 31:2546-2552 |
| ISSN: |
0261-3069 |
| DOI: |
10.1016/j.matdes.2009.11.031 |
| Popis: |
In this work, finite element analysis (FEA) of the shear punch testing is carried out to study the specimen deformation up to yielding and the results are compared and validated with experimental data for four different materials. The elastic portion of the FEA generated load–displacement curve overlaps with the corresponding experimental curve only when the fixture compliances are eliminated in experiments. Based on through thickness plasticity in the FEA study, the shear yield stress estimated at an offset of 0.15% of normalized displacement compares well with the experimentally determined shear yield strength and satisfies the von Mises yield relation σ ys = 1.73 τ ys . The effects of die-punch clearance and specimen thickness on shear yield strength studied using FEA are also discussed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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