3D Atom Probe and SIMS as complementary techniques for the observation and quantitative measurement of microstructures

Autor:	Francois Horreard, I. Martin, L Renaud, Francois Hillion, YS Yang, JS Kang, Chan Gyung Park
Rok vydání:	2008
Předmět:	Materials science law Nanotechnology Atom probe Microstructure Instrumentation law.invention
Zdroj:	Microscopy and Microanalysis. 14:1232-1233
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927608084316
Popis:	Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::545aa5cd4567d91b975b3be9baff65d3 https://doi.org/10.1017/s1431927608084316 Zobrazit plný text záznamu