Optimization of structural, surface and electrical properties of solution processed LaNiO3 conducting oxide
| Autor: | Nirav C. Pandya, Utpal S. Joshi |
|---|---|
| Rok vydání: | 2015 |
| Předmět: |
Nanostructure
Materials science biology Annealing (metallurgy) Oxide Mineralogy Crystal structure Condensed Matter Physics biology.organism_classification Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials chemistry.chemical_compound Chemical engineering chemistry Electrical resistivity and conductivity Lanio Crystallite Electrical and Electronic Engineering Thin film |
| Zdroj: | Journal of Materials Science: Materials in Electronics. 26:2445-2450 |
| ISSN: | 1573-482X 0957-4522 |
| DOI: | 10.1007/s10854-015-2704-1 |
| Popis: | Growth, structural and electrical properties of perovskite type LaNiO3 thin film nanostructures using chemical solution deposition at annealing temperatures ranging from 550 to 800 °C has been optimized. Poly-vinyl alcohol was used as stabilizing agent in the precursor solutions. X-ray diffraction and AFM, respectively confirmed phase purity and nanostructured growth with mono dispersed crystallite distribution at processing temperature of 700 °C. Crystalline strain as low as 1 % was estimated from the XRD peaks; confirming relaxed and stable LNO crystalline structure deposited on quartz substrate. A systematic variation in the resistivity and carrier concentration with annealing temperatures were observed, revealing that 700 °C is an optimum temperature for a phase pure LNO films with smooth surface structures. |
| Databáze: | OpenAIRE |
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