iDD, pulse response testing: A unified approach to testing digital and analogue ICs
| Autor: | Hema Ramamurthy, Jaime Ramirez-Angulo, J.S. Beasley, Mark R. DeYong |
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| Rok vydání: | 1993 |
| Předmět: |
Very-large-scale integration
Digital electronics Engineering Pulse response Fabrication business.industry technology industry and agriculture Electrical engineering Integrated circuit Test method Power (physics) law.invention law parasitic diseases Electronic engineering Transient (oscillation) Electrical and Electronic Engineering business |
| Zdroj: | Electronics Letters. 29:2101 |
| ISSN: | 0013-5194 |
| DOI: | 10.1049/el:19931405 |
| Popis: | A test method is presented for detecting defects and fabrication variations in both digital and analogue circuits by simultaneously pulsing the power supply rails and analysing the temporal and/or the spectral characteristics of the resulting transient rail currents. The presented method has a distinct advantage over other forms of i DD testing because it requires a single test vector to excite and expose the presence of a defect or fabrication variations |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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