SERS based detection of Dichlorvos pesticide using silver nanoparticles arrays: Influence of array wavelength/amplitude
| Autor: | C. Murali Krishna, Vivek Pachchigar, Mukesh Ranjan, Sebin Augustine, K.P. Sooraj |
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| Rok vydání: | 2021 |
| Předmět: |
Materials science
Ion beam business.industry Ripple General Physics and Astronomy Nanoparticle 02 engineering and technology Surfaces and Interfaces General Chemistry Substrate (electronics) 010402 general chemistry 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Silver nanoparticle 0104 chemical sciences Surfaces Coatings and Films Ion Wavelength Optoelectronics Irradiation 0210 nano-technology business |
| Zdroj: | Applied Surface Science. 544:148878 |
| ISSN: | 0169-4332 |
| Popis: | Ion beam irradiation produced ripple nanopatterns on Si surface was used to produce a highly dense and sensitive SERS substrate for detecting Dichlorvos pesticide below the permissible limit. The wavelength of the ripple varied from 22 nm to 35 nm by changing ion beam energy from 200 eV to 500 eV. Highly regular nanoparticles arrays were produced down to 22 nm wavelength choosing the proper ion beam parameter and ripple orientation during deposition. The shape of deposited nanoparticles on ripple nanostructures changed from elongated to spherical upon increasing wavelength and amplitude of ripples at different ion energies. The optimization of SERS intensity was carried out using crystal violet dye which revealed that the maximum enhancement (enhancement factor ~107) occurred for the 300 eV irradiated substrate. The optimized substrate was used for detecting Dichlorvos up to 1 ppm level without using any binder molecule. |
| Databáze: | OpenAIRE |
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