Growth and characterization of superconducting films Tl0.78Bi0.22Sr1.6Ba0.4Ca2Cu3O9 on CeO2-buffered single crystal YSZ
| Autor: | J.Y. Lao, W Li, D.Z. Wang, Darren Verebelyi, J.H. Wang, Mariappan Parans Paranthaman, David K. Christen, Z.F. Ren |
|---|---|
| Rok vydání: | 1998 |
| Předmět: |
Materials science
Annealing (metallurgy) Analytical chemistry Energy Engineering and Power Technology chemistry.chemical_element Yttrium Condensed Matter Physics Electronic Optical and Magnetic Materials law.invention Amorphous solid Full width at half maximum chemistry law Electrical resistivity and conductivity Electrical and Electronic Engineering Crystallization Single crystal Yttria-stabilized zirconia |
| Zdroj: | Physica C: Superconductivity. 306:149-153 |
| ISSN: | 0921-4534 |
| DOI: | 10.1016/s0921-4534(98)00346-3 |
| Popis: | Crystalline CeO 2 as a buffer layer on single crystal yttrium stabilized zirconia (YSZ) has been deposited in situ at 600–650°C by laser ablation. Following the deposition of CeO 2 , Tl 0.78 Bi 0.22 Sr 1.6 Ba 0.4 Ca 2 Cu 3 O 9 ((Tl,Bi)-1223) amorphous films were deposited on the CeO 2 -buffered YSZ substrate at room temperature. The deposited amorphous films were then wrapped together with an unfired Tl 0.95 Bi 0.22 Sr 1.6 Ba 0.4 Ca 2 Cu 3 O 9 pellet in silver foil. The whole package was finally annealed ex situ in a tube furnace at 790–810°C with flowing argon to crystallize the films. X-ray diffraction (XRD) shows that the annealed films consist of mainly c -axis aligned (Tl,Bi)-1223 phase with a small amount of (Tl,Bi)-1212 phase. The full width at half maximum (FWHM) values of XRD ω-scans at (007) of (Tl,Bi)-1223 phase and (005) of (Tl,Bi)-1212 phase are 0.44° and 0.48° respectively. XRD ϕ-scans on (102) of both (Tl,Bi)-1223 and (Tl,Bi)-1212 phases show an excellent in-plane alignment with FWHM values of 0.44° and 0.54°, respectively. Four-probe transport measurements show superconducting transition temperatures ( T c 's) of 105–109 K depending on the annealing conditions. At 77 K and zero external magnetic field, transport critical current density ( J c ) is in the range of (0.6–1)×10 6 A/cm 2 for samples with thickness of 1.5–1.8 μm. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full Text from ScienceDirect