| Autor: |
Stewart D. McDougall, I. B. Petrescu-Prahova, T. Moritz, John H. Marsh, D. Bambrick, D. Silan, E. Goutain, P. Modak, Bocang Qiu, J. Riordan |
| Rok vydání: |
2009 |
| Předmět: |
|
| Zdroj: |
SPIE Proceedings. |
| ISSN: |
0277-786X |
| DOI: |
10.1117/12.810041 |
| Popis: |
Record values for the rollover power and rollover linear power densities of 9xx nm devices, obtained by simultaneous scaling of length and d/Γ, are reported. The values for d/Γ lay in the range 0.8 μm to 1.2 μm with corresponding cavity lengths from 3.5 mm to 5 mm. The transversal structures were asymmetric, with a higher refractive index on the n side. An optical trap was helpful in reducing the radiation extension on the p side and the overall thickness. The highest rollover linear power densities were 244 mW/μm for structures without an optical trap and 290 mW/μm for those that included an optical trap. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
