Evaluation of FT-IR Measurement Accuracy in Transmittance and Reflectance Measurements

Autor:	S. G. Kaplan, L. M. Hanssen
Rok vydání:	1999
Předmět:	Accuracy and precision Materials science Observational error Optics business.industry Transmittance Sources of error Fourier transform infrared spectroscopy Spectroscopy business Reflectivity Refractive index
Zdroj:	Fourier Transform Spectroscopy: New Methods and Applications.
DOI:	10.1364/fts.1999.fwe19
Popis:	FT-IR spectroscopy is susceptible to numerous sources of error, any number of which can potentially result in large measurement errors.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::530eefd123c5172eecdbdb6ef44c4fce https://doi.org/10.1364/fts.1999.fwe19 Zobrazit plný text záznamu