X-ray photoelectron diffraction and surface core-level shift study of clean InP(001)
| Autor: | Yoshiko Suzuki, Noriaki Sanada, Y. Fukuda, W.R.A. Huff, Han Woong Yeom, Akito Kakizaki, T. Takeuchi, S. Kono, G. Kaneda, Tadashi Abukawa, Masaru Shimomura |
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| Rok vydání: | 1998 |
| Předmět: |
Diffraction
Chemistry Photoemission spectroscopy Binding energy Analytical chemistry Synchrotron radiation chemistry.chemical_element Surfaces and Interfaces Condensed Matter Physics Surfaces Coatings and Films chemistry.chemical_compound X-ray photoelectron spectroscopy Materials Chemistry Indium phosphide Indium Surface reconstruction |
| Zdroj: | Surface Science. :625-630 |
| ISSN: | 0039-6028 |
| Popis: | A clean InP(001) surface treated by ion-bombardment and annealing (IBA) has been studied by X-ray photoelectron diffraction (XPD) and synchrotron radiation based photoemission spectroscopy (SRPES). The XPD pattern of In 3d 5/2 (measured at 55° from the surface normal) is compared with a calculated XPD pattern obtained from a single-scattering cluster simulation. Our results indicate that IBA-treated InP(001) exhibits a (2×4) surface reconstruction. That is, the two-fold and four-fold directions correspond to the [1 1 0] and [110] axes, respectively. For the SRPES study, In 4d core-level spectra ( hν =70 eV) were collected at a variety of photoemission angles. Four spin–orbit doublets were necessary to obtain a high-quality fit to the photoemission spectra. As the detection angle was changed toward the surface parallel, a component having a lower binding energy by 0.70 eV than that of the bulk undergoes a dramatic intensity increase. On the basis of the energy shift and polar angle dependence of this component, we suggest that it arises from surface-layer indium atoms bonded to other indium atoms. The origins of other components are discussed. |
| Databáze: | OpenAIRE |
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