Validating Optimized 22FDSOI Standard cells with Enhanced Design Rules
Autor: | Navneet Jain, Juhan Kim, Jeff Kim, Deepti Pant, Shibly Ahmed, Nigel Chan, Mahbub Rashed |
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Rok vydání: | 2022 |
Zdroj: | 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM). |
Databáze: | OpenAIRE |
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