Validating Optimized 22FDSOI Standard cells with Enhanced Design Rules

Autor:	Navneet Jain, Juhan Kim, Jeff Kim, Deepti Pant, Shibly Ahmed, Nigel Chan, Mahbub Rashed
Rok vydání:	2022
Zdroj:	2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::52f78c2e0fe03d6d5addef3c3d01cbb6 https://doi.org/10.1109/edtm53872.2022.9797964 Zobrazit plný text záznamu