A Method to Determine the Located Region of Lateral Trap Position by Analysis of Three-Level Random Telegraph Signals in n-MOSFETs

Autor:	Yong En Syu, Kuan Ju Liu, Yu-Ju Hung, Wei Kung Tsai, Ching-En Chen, Ting-Chang Chang, Szu-Han Ho, Bo You, Tseung-Yuen Tseng, Kuo Yu Chenge, Wen-Hung Lo, Ying Hsin Lu, Jyun Yu Tsai, James Wu
Rok vydání:	2015
Předmět:	Trap (computing) Materials science Position (vector) Electrical and Electronic Engineering Atomic physics Three level Electronic Optical and Magnetic Materials
Zdroj:	ECS Solid State Letters. 4:Q47-Q49
ISSN:	2162-8750 2162-8742
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::529c7611d81c42a2f8a554662b7bb789 https://doi.org/10.1149/2.0041510ssl Zobrazit plný text záznamu