| Autor: |
Alexey Korotkov, Vladimir Kozlov, Victor A. Chechetkin |
| Rok vydání: |
2019 |
| Předmět: |
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| Zdroj: |
2019 International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON). |
| DOI: |
10.1109/sibircon48586.2019.8958168 |
| Popis: |
This paper discusses the study of the field strength inside the TEM cell. We compare the results of measuring the reflection coefficient and field strength for the model in the electromagnetic simulation software and the manufactured prototype. The measurements were carried out for three values of frequency and five values of excitation power to obtain absolute values of the electromagnetic field strength. A feature of calculating the field inside the cell during modeling is noted. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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