| Autor: |
C. T. Koch |
| Rok vydání: |
2009 |
| Předmět: |
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| Zdroj: |
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ISBN: 9783540851547 |
| DOI: |
10.1007/978-3-540-85156-1_47 |
| Popis: |
Recent advances in the development of electron optics have pushed the available information limit in high resolution electron microscopy (HRTEM) and scanning transmission electron microscopy (STEM) well beyond the 1A boundary. With increasing resolution multiple elastic scattering of electrons within the sample and thermal diffuse scattering make a direct image interpretation increasingly difficult, calling for quantitative methods to simulate images to compare with the experiment. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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