Autor:	Min-Feng Ku, Ru-Ying Huang, Yian-Liang Kuo, Ming-Sung Hsu, Yu-Ting Lin, Chih-Horng Chang
Rok vydání:	2011
Předmět:	Computer science Fault detection and isolation Reliability engineering
Zdroj:	International Symposium for Testing and Failure Analysis.
ISSN:	0890-1740
DOI:	10.31399/asm.cp.istfa2011p0060
Popis:	This paper uses an interesting specific case study to highlight the non-destructive fault isolation demonstration of 3DIC stacked dies applied the optical beam induced resistance change (OBIRCH) approach.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::526dad64bd53e20fb1a1a06d2e53e41e https://doi.org/10.31399/asm.cp.istfa2011p0060 Zobrazit plný text záznamu