Microstructure and Optical Property in an Irregular Multilayer Comprising Ferroelectric and Paraelectric Materials

Autor:	Rui Cong, Nengli Dai, Guomin Yu, G.J. Hu, J. H. Chu, X. K. Hong
Rok vydání:	2012
Předmět:	Materials science business.industry Optical property Dielectric Microstructure Ferroelectricity Reflectivity Optics Scanning transmission electron microscopy Materials Chemistry Ceramics and Composites Optoelectronics business Porosity Diffractometer
Zdroj:	Journal of the American Ceramic Society. 96:355-357
ISSN:	0002-7820
DOI:	10.1111/jace.12132
Popis:	A special sequence of multilayer, consisting of PbZr0.5Ti0.5O3 and SrTiO3 films, was fabricated using a simple chemical solution deposition. X-ray diffractometer (XRD) measurement reveals that each film in this multilayer has been crystallized into the single perovskite phase. The high-angle annular dark-field scanning transmission electron microscopy (STEM) image shows that the obtained SrTiO3/PbZr0.5Ti0.5O3 multilayer contains three components with different optical thicknesses: dense and porous PbZr0.5Ti0.5O3 layers, together with dense SrTiO3 layers. This multilayer system exhibits superior optical performance, with a peak reflectivity of∼95% and a bandwidth of ∼113 nm, rendering its promising candidate as dielectric mirrors, optical cavities, and selective filters.
Databáze:	OpenAIRE
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