Microdomain Patterns Recorded by an Electron Beam in He-Implanted Optical Waveguides on X-Cut LiNbO 3 Crystals
| Autor: | T. R. Volk, Stanislav M. Shandarov, M. V. Borodin, S. D. Lavrov, Radmir V. Gainutdinov, Yadviga V. Bodnarchuk, L. S. Kokhanchik, Feng Chen, Hongliang Liu |
|---|---|
| Rok vydání: | 2015 |
| Předmět: | |
| Zdroj: | Journal of Lightwave Technology. 33:4761-4766 |
| ISSN: | 1558-2213 0733-8724 |
| DOI: | 10.1109/jlt.2015.2480496 |
| Popis: | We present the results of studies in planar optical waveguides fabricated by He-ion implantation with the energy of 500 keV in X-cut LiNbO3 crystals. The thickness of the formed waveguide layer confined by the depth D of the implanted layer is of about 1.06 μm. The refractive indices as well as differences in refractive indices were evaluated for wavelengths $\lambda = 445$ , 626.5, and 650 nm. Domain gratings with the period $\Lambda = 4$ μm were recorded in these samples by electron beam irradiation with acceleration voltages U in the range from 5 to 25 kV. Gratings characteristics measured by the PFM method were obtained for different domain thicknesses Td determined by U . The optimum grating regularity is achieved when the domain growth occurs beyond the He-implanted damaged barrier, i.e., at $T_{d} \le D$ , which in the given case corresponds to $U = 10$ and 15 kV. Otherwise, ( $T_{d} > D$ ), the domain evolution is affected by the structurally damaged layer and the gratings become irregular. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|