Electron microscopic investigations on optical oxide single crystal
| Autor: | L. Malicskó |
|---|---|
| Rok vydání: | 1990 |
| Předmět: |
Reflection high-energy electron diffraction
Chemistry Scanning electron microscope business.industry Physics::Optics General Chemistry Condensed Matter Physics Laser law.invention Optics Electron diffraction law Transmission electron microscopy Scanning transmission electron microscopy Energy filtered transmission electron microscopy Optoelectronics General Materials Science business Single crystal |
| Zdroj: | Crystal Research and Technology. 25:187-195 |
| ISSN: | 1521-4079 0232-1300 |
| DOI: | 10.1002/crat.2170250217 |
| Popis: | Scanning and transmission electron microscopic methods including energy dispersive X-ray spectrometry and reflection high energy electron diffraction as well, were used for the inspection of the growth, the shape-processing and the laser irradiation induced defects in pure and doped optical oxyde single crystals. Some general results will be presented and discussed in the light of theoretical predictions. |
| Databáze: | OpenAIRE |
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