Tool Condition Monitoring in Micro-End Milling using wavelets

Autor:	K. Sandeep, Ashutosh Roushan, K Patra, U. S. Rao, N K Dubey
Rok vydání:	2018
Předmět:	0209 industrial biotechnology Tool condition monitoring 020303 mechanical engineering & transports 020901 industrial engineering & automation Wavelet 0203 mechanical engineering Computer science End milling Mechanical engineering Wavelet transform 02 engineering and technology Tool wear
Zdroj:	IOP Conference Series: Materials Science and Engineering. 346:012045
ISSN:	1757-899X 1757-8981
DOI:	10.1088/1757-899x/346/1/012045
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::518b0256e51abdd149093a0a2001649e https://doi.org/10.1088/1757-899x/346/1/012045 Zobrazit plný text záznamu