Multiplexed identical broad-band-chirped grating interrogation system for large-strain sensing applications
| Autor: | R.W. Fallon, Leishi Zhang, I. Bennion |
|---|---|
| Rok vydání: | 1997 |
| Předmět: |
Materials science
Sensing applications business.industry Broad band Optical power Grating Multiplexing Atomic and Molecular Physics and Optics Electronic Optical and Magnetic Materials Intelligent sensor Optics Fiber Bragg grating Optoelectronics Electrical and Electronic Engineering business Diffraction grating |
| Zdroj: | IEEE Photonics Technology Letters. 9:1616-1618 |
| ISSN: | 1941-0174 1041-1135 |
| DOI: | 10.1109/68.643287 |
| Popis: | We report here a simple and low-cost technique for extreme strain measurement. The overlapping of a chirped sensor grating with an identical reference device provides a novel mechanism for measuring strain. This system permits a linear relationship between strain and resultant optical power. The maximum sensing range of the system is determined by the bandwidths of the gratings employed. A 20-nm chirped grating facilitates a sensing range up to 20 000 /spl mu//spl epsiv/. This paper also demonstrates an arrangement for multiplexing up to four gratings, which can be rapidly and truly simultaneously interrogated. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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