Near field microscopy for the diagnosis and characterization of materials

Autor: T. B. Berbar, Azzedine Nacer, Hakim Kharroubi, Mezdad Dihya
Rok vydání: 2018
Předmět:
Zdroj: 2018 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM).
DOI: 10.1109/cistem.2018.8613575
Popis: In this work, a near field microscopy for diagnosis and characterization of materials is presented. The method is based on the association of microstrip microwave probes and a network vector analyzer. The reflection coefficient is measured as the tip of the probe sweeps and analyzes the device under test without contact. This tip radiates an electromagnetic field whose wavelength is large front of comparatively to the distance between the tip and the device. The variations of the reflection coefficient and the quality factor are related to the electrical properties of the material under the tip.
Databáze: OpenAIRE