Near field microscopy for the diagnosis and characterization of materials
Autor: | T. B. Berbar, Azzedine Nacer, Hakim Kharroubi, Mezdad Dihya |
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Rok vydání: | 2018 |
Předmět: |
Electromagnetic field
Materials science business.industry 02 engineering and technology 010402 general chemistry 021001 nanoscience & nanotechnology 01 natural sciences Microstrip 0104 chemical sciences Characterization (materials science) Wavelength Optics Device under test Near-field scanning optical microscope Reflection coefficient 0210 nano-technology business Microwave |
Zdroj: | 2018 International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM). |
DOI: | 10.1109/cistem.2018.8613575 |
Popis: | In this work, a near field microscopy for diagnosis and characterization of materials is presented. The method is based on the association of microstrip microwave probes and a network vector analyzer. The reflection coefficient is measured as the tip of the probe sweeps and analyzes the device under test without contact. This tip radiates an electromagnetic field whose wavelength is large front of comparatively to the distance between the tip and the device. The variations of the reflection coefficient and the quality factor are related to the electrical properties of the material under the tip. |
Databáze: | OpenAIRE |
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