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A [FePt (1 nm)/Ag 2 Te( t )] 10 (thickness t = 0.1–0.3 nm) multilayer was deposited alternately on glass substrate and subsequently annealed by a rapid thermal process (RTP). After the RTP, the interface between FePt and Ag 2 Te was intermixed, forming particulate films. The L1 0 FePt grain size decreases from 23 to 14 nm as t of the Ag 2 Te intermediate layer increases from 0.1 to 0.3 nm. The (FePt/Ag 2 Te) 10 particulate film shows perpendicular magnetization. Compared to (FePt/Ag 2 Te) 10 , the Ag/(FePt/Ag 2 Te) 10 /Ag multilayer also shows perpendicular magnetization with less c -axis dispersion. The Ag capping and seed layers reduce the ordering temperature of FePt but facilitate its grain growth during RTP. As a result, the FePt grains are refined and well-separated by the Ag 2 Te phase, but change to a continuous film after inserting Ag capping and seed layers. |
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