Techniques for THz beams evaluations

Autor: T. Vasile, V. Damian
Rok vydání: 2017
Předmět:
Zdroj: 2017 International Semiconductor Conference (CAS).
DOI: 10.1109/smicnd.2017.8101208
Popis: We present some preliminary measurement results for evaluating the THz beams profile of a THz — TDS system. The evaluation of the profile was done for some frequencies across the THz burst spectrum. We used two methods: a raster scanning and the Hadamard sampling of the image for the Fellgett advantage.
Databáze: OpenAIRE