Heritability estimates of field resistance to spot blotch in four spring wheat crosses

Autor:	R. C. Sharma, M. R. Bhatta, H. J. Dubin, R. N. Devkota
Rok vydání:	1997
Předmět:	Chlorosis biology food and beverages Plant Science Plant disease resistance Heritability biology.organism_classification Bipolaris Horticulture Agronomy Genetics Leaf spot Poaceae Cultivar Disease progress Agronomy and Crop Science
Zdroj:	Plant Breeding. 116:64-68
ISSN:	1439-0523 0179-9541
DOI:	10.1111/j.1439-0523.1997.tb00976.x
Popis:	Spot blotch of wheat (Triticum aestivum L.), caused by Bipolaris sorokiniana (Sacc. in Sorok.) Shoem., is a major disease in South Asia. Popular commercial cultivars have low levels of resistance to spot blotch. Information on the inheritance of spot blotch resistance in wheat is lacking. Field studies were conducted in four wheat crosses, each involving a Chinese hexaploid parent with high levels ofresistance and a commercial cultivar with low to intermediate levels of resistance to spot blotch. Data were recorded in the F2, F3 and F4 generations to estimate heritability. Field studies were conducted in three years (1992-94) at Rampur, Nepal, involving 150 lines in each cross. The spot blotch score was recorded as the percentage necrosis and associated chlorosis of the two upper most leaf surface. In the F2 generation three spot blotch readings on the flag leaf were taken whereas in the F 3 and F 4 generations four readings were recorded at 5-day intervals on the flag and the penultimate leaves. The highest disease score (HDS) and the area under disease progress curve (AUDPC) were analysed. Heritability (h 2 ) estimates for spot blotch resistance were intermediate to high measured in terms of HDS (0.47
Databáze:	OpenAIRE
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