Force Modulation Atomic Force Microscopy as a Powerful Tool in Organic-Inorganic Hybrid Materials Analysis

Autor:	J. G. Kuchler, W. Hiller, B. Corain, G. Schiavon
Rok vydání:	2001
Předmět:	Kelvin probe force microscope Nanocomposite Materials science Mechanics of Materials Modulation Atomic force microscopy Mechanical Engineering Organic inorganic General Materials Science Nanotechnology Magnetic force microscope Hybrid material
Zdroj:	Advanced Materials. 13:310-313
ISSN:	1521-4095 0935-9648
DOI:	10.1002/1521-4095(200103)13:5<310::aid-adma310>3.0.co;2-c
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::5015d849a2f237cfc9408df255035ce6 https://doi.org/10.1002/1521-4095(200103)13:5<310::aid-adma310>3.0.co Zobrazit plný text záznamu Plný text