Low-freouency Fluctuation Characteristics And Current Stability Of Thin Film Field Emission Cathodes

Autor:	N.N. Chubun, Y.M. Yumaghuzin, S.S. Ghots, R. Z. Bakhtizin, B.C. Djueua
Rok vydání:	2005
Předmět:	Field electron emission Materials science law Transistor Analytical chemistry Thin film Current (fluid) Engineering physics Stability (probability) Cathode law.invention
Zdroj:	[Proceedings] IVMC '93 Sixth International Vacuum Microelectronics Conference.
DOI:	10.1109/ivmc.1993.700253
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4ffc41662d36fcbe0d59275ab2815680 https://doi.org/10.1109/ivmc.1993.700253 Zobrazit plný text záznamu