Effect of dispersion on metal-insulator-metal infrared absorption resonances
| Autor: | Vanessa C. Lowry, Jonathan R. Brescia, Janardan Nath, Robert E. Peale, Evan M. Smith, Chris J. Fredricksen, Reid Stack, Rachel N. Evans, Justin W. Cleary, Seth Calhoun |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
Infrared business.industry Physics::Optics Infrared spectroscopy 02 engineering and technology Dielectric 021001 nanoscience & nanotechnology 01 natural sciences 010309 optics Condensed Matter::Materials Science Wavelength chemistry.chemical_compound Silicon nitride chemistry 0103 physical sciences Dispersion (optics) Optoelectronics General Materials Science 0210 nano-technology Absorption (electromagnetic radiation) business Refractive index |
| Zdroj: | MRS Communications. 8:830-834 |
| ISSN: | 2159-6867 2159-6859 |
| Popis: | Metal-insulator-metal (MIM) resonant absorbers comprise a conducting ground plane, a thin dielectric, and thin separated metal top-surface structures. The dielectric SiO2 strongly absorbs near 9 μm wavelength and has correspondingly strong long-wave-infrared (LWIR) dispersion for the refractive index. This dispersion results in multiple absorption resonances spanning the LWIR, which can enhance broad-band sensitivity for LWIR bolometers. Similar considerations apply to silicon nitride Si3N4. TiO2 and AlN have comparatively low dispersion and give simple single LWIR resonances. These dispersion-dependent features for infrared MIM devices are demonstrated by experiment, electrodynamic simulation, and an analytic model based on standing waves. |
| Databáze: | OpenAIRE |
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