Deep Learning-based AOI System for Detecting Component Marks

Autor:	Yi-Ming Chang, Ti-Li Lin, Hung-Chun Chi, Wei-Kai Lin
Rok vydání:	2023
Zdroj:	2023 IEEE International Conference on Big Data and Smart Computing (BigComp).
DOI:	10.1109/bigcomp57234.2023.00046
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4f7f3e0c5c97c4b7531a8464b9231d47 https://doi.org/10.1109/bigcomp57234.2023.00046 Zobrazit plný text záznamu