Erratum: 'Spectroscopic ellipsometry-based study of optical properties of amorphous and crystalline ZnSnO alloys and Zn2SnO4 thin films grown using sputtering deposition: Dielectric function and subgap states' [J. Appl. Phys. 119, 135302 (2016)]
| Autor: | Hosun Lee, Dae Ho Jung, Kun Hee Ko, Jun Woo Park, Hyeon Seob So |
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| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science business.industry Band gap Wide-bandgap semiconductor General Physics and Astronomy 02 engineering and technology Sputter deposition 021001 nanoscience & nanotechnology 01 natural sciences Amorphous solid Ellipsometry 0103 physical sciences Optoelectronics Spectroscopic ellipsometry Dielectric function Thin film 0210 nano-technology business |
| Zdroj: | Journal of Applied Physics. 123:089901 |
| ISSN: | 1089-7550 0021-8979 |
| DOI: | 10.1063/1.5022103 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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