Evaluation of High-Resolution STEM Imaging Advancement Under Gas-Environment with Open Window MEMS Holder and Gas Injection System

Autor:	Kuniyasu Nakamura, Hiromi Inada, Yudai Kubo, Hiroaki Matsumoto, Manabu Shirai, Masahiro Kawasaki, Akinari Hanawa, Hideki Kikuchi
Rok vydání:	2019
Předmět:	Microelectromechanical systems Materials science business.industry Optoelectronics High resolution Window (computing) business Instrumentation
Zdroj:	Microscopy and Microanalysis. 25:694-695
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927619004203
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4f5d7dd5af1e2fb52bd05a0d1b73a08b https://doi.org/10.1017/s1431927619004203 Zobrazit plný text záznamu