Modeling of carrier lifetime based on Deep-Level Transient Spectroscopy for power PIN diodes

Autor:	Imen Abdennabi, Nathalie Batut, Ambroise Schellmanns, Lionel Jaouen, Fabrice Roqueta, Arnaud Yvon, Sophie Ngo
Rok vydání:	2022
Zdroj:	2022 IEEE International Conference on Electrical Sciences and Technologies in Maghreb (CISTEM).
DOI:	10.1109/cistem55808.2022.10043947
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4f5bb6c616d2193ec2f4e52ceb7af416 https://doi.org/10.1109/cistem55808.2022.10043947 Zobrazit plný text záznamu