The method of determining the Probability of Affection of the Semiconductor Elements under the influence of the Multifrequency Space-Time Signals

Autor:	Volodymyr Horbenko
Rok vydání:	2020
Předmět:	Semiconductor business.industry Affection media_common.quotation_subject Acoustics Space time General Engineering Psychology business media_common
Zdroj:	International Journal of Emerging Trends in Engineering Research. 8:1776-1779
ISSN:	2347-3983
DOI:	10.30534/ijeter/2020/46852020
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4f5649ddb934dfa4bedc9c2df2727346 https://doi.org/10.30534/ijeter/2020/46852020 Zobrazit plný text záznamu