A 16nm All-Digital Hardware Monitor for Evaluating Electromigration Effects in Signal Interconnects Through Bit-Error-Rate Tracking

Autor:	Nakul Pande, Chen Zhou, Ming-Hsien Lin, Rita Fung, Richard Wong, Shi-Jie Wen, Chris H. Kim
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Safety Risk Reliability and Quality Electronic Optical and Magnetic Materials
Zdroj:	IEEE Transactions on Device and Materials Reliability. 22:194-204
ISSN:	1558-2574 1530-4388
DOI:	10.1109/tdmr.2022.3156807
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4ece669c7066056bbd55dadd8ca4512f https://doi.org/10.1109/tdmr.2022.3156807 Zobrazit plný text záznamu