Evolution of reverse recovery in trench MOSFETs

Autor: U. Medic, A. Ferrara, R. Siemieniec, Oliver Blank, Michael Hutzler, Timothy D. Henson
Rok vydání: 2020
Předmět:
Zdroj: 2020 32nd International Symposium on Power Semiconductor Devices and ICs (ISPSD).
Popis: The interaction between the reverse recovery charge and the output charge in trench power MOSFETs is discussed. As the trade-off between the on-resistance and the gate charge improves, the output capacitance has more impact on the reverse recovery losses. The evolution of reverse recovery with trench technology is investigated by double-pulse measurements and TCAD simulations.
Databáze: OpenAIRE