| Popis: |
Aiming at the problems of electronic equipment long service life, less failure data and the reliability prediction, based on the analysis of physics of failure mechanism, a correlation competing failure model for the performance degradation process of electronic equipment under multi-type shocks is established, and the dynamic threshold is analyzed to obtain a more realistic reliability model. On the basis of stress damage analysis and structural analysis, this article presents the pre-evaluation process, and applies a kind of improved entropy weight method to comprehensively select and calculate the parameters describing the overall performance. Finally, by simulating the degradation process of the laser, the variation rule of its reliability is obtained, and the rationality and validity of the model are verified. |
