Cu deposition using a permanent magnet electron cyclotron resonance microwave plasma source

Autor: R. L. Rhoades, S. M. Gorbatkin, Lee A. Berry
Rok vydání: 1994
Předmět:
Zdroj: Thin Solid Films. 253:382-385
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)90352-2
Popis: An electron cyclotron resonance (ECR) plasma has been used in conjunction with a solid metal sputter target for Cu deposition over 200-mm diameters. The goal is to develop a deposition process suitable for filling submicron, high aspect ratio features used for ultralarge scale integration. The system uses a permanent magnet for creation of the magnetic field necessary for ECR and is significantly more compact than systems equipped with electromagnets. A custom launcher design allows remote microwave injection with the microwave entrance window shielded from the Cu flux. Cu deposition rates up to 100 nm/min were observed and film resistivities were typically in the low to mid 2 {mu}ohm-cm range. Based on deposition rate measurements at two radial sample position, uniformities of a few % over 200-mm diameters should be attainable.
Databáze: OpenAIRE