Curing of 1-Transistor-DRAM by Joule Heat From Punch-Through Current

Autor:	Hyun-Jung Kim, Geon-Beom Lee, Joon-Kyu Han, Seong-Joo Han, Da-Jin Kim, Ji-Man Yu, Myung-Su Kim, Yang-Kyu Choi
Rok vydání:	2022
Předmět:	Electrical and Electronic Engineering Electronic Optical and Magnetic Materials
Zdroj:	IEEE Electron Device Letters. 43:370-373
ISSN:	1558-0563 0741-3106
DOI:	10.1109/led.2022.3147259
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::4ebbe035caf8abb2b75292339d3ba1b3 https://doi.org/10.1109/led.2022.3147259 Zobrazit plný text záznamu